KGx – Tom Katsioulas: Component-based supply chain provenance, traceability and digital thread of…

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MEPTEC KGx
Component-based supply chain provenance, traceability and digital thread of test data
Tom Katsioulas
GSA Global

Known Good Die (KGD) products are facing economic and logistical headwinds. Meeting this next-generation KGD challenge will require better system insights at every stage: test, assembly and in-field, especially with the 2.5/3D heterogeneous integration revolution underway. To achieve this, we need new ways of understanding SoC health through comprehensive and predictive monitoring methods that combine chip telemetry with ML-driven insights. This session will highlight how proteanTecs’ deep data analytics elevates both quality and performance and minimizes these headwinds. Example applications that will be discussed enable shift left decisions, latent defect detection, application stress monitoring, power optimization and characterization optimization – from wafer testing to system testing and multi-chip packages, as well as visibility D2D interfaces with interconnect monitoring at every stage.

By: MEPTEC
Title: KGx – Tom Katsioulas: Component-based supply chain provenance, traceability and digital thread of…
Sourced From: www.youtube.com/watch?v=ICdgnl4O19E

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